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1

Preparation of high-quality stress-free (001) aluminum nitride thin film using a dual Kaufman ion-beam source setup

Gablech, Imrich, Svatoš, Vojtěch, Caha, Ondřej, Dubroka, Adam, Pekárek, Jan, Klempa, Jaroslav, Neužil, Pavel, Schneider, Michael, Šikola, Tomáš

Journal:

Thin Solid Films

Year:

2019

Language:

english

File:

PDF, 1.84 MB

english, 2019

2

High resolution time-of-flight low energy ion scattering

M. Draxler, S.N. Markin, M. Kolíbal, S. Průša, T. Šikola, P. Bauer

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2005

Language:

english

File:

PDF, 106 KB

english, 2005

3

Thermal stability of undoped polycrystalline silicon layers on antimony and boron-doped substrates

D. Lysáček, L. Válek, J. Spousta, T. Šikola, R. Špetík

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 966 KB

english, 2010

4

Ab initio study of thin metallic and ceramic films

D. Rafaja, V. Valvoda, T. Šikola, J. Spousta

Journal:

Thin Solid Films

Year:

1998

Language:

english

File:

PDF, 373 KB

english, 1998

5

Über die Reaktion von Thiophosphoryltrichlorid mit Hexamethyldisilazan

Prof. Dr. K. Dostâl, Dr. J. Šikola, Dr. M. Meisel, Prof. Dr. H. Grunze

Journal:

Zeitschrift für anorganische und allgemeine Chemie

Year:

1986

Language:

german

File:

PDF, 458 KB

german, 1986

6

Dynamic switching of the spin circulation in tapered magnetic nanodisks

Uhlíř, V., Urbánek, M., Hladík, L., Spousta, J., Im, M-Y., Fischer, P., Eibagi, N., Kan, J. J., Fullerton, E. E., Šikola, T.

Journal:

Nature Nanotechnology

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

7

Real-Time Observation of Collector Droplet Oscillations during Growth of Straight Nanowires

Kolíbal, Miroslav, Vystavěl, Tomáš, Varga, Peter, Šikola, Tomáš

Journal:

Year:

2014

Language:

english

File:

PDF, 3.51 MB

english, 2014

8

Stress-free deposition of [001] preferentially oriented titanium thin film by Kaufman ion-beam source

Gablech, Imrich, Caha, Ondřej, Svatoš, Vojtěch, Pekárek, Jan, Neužil, Pavel, Šikola, Tomáš

Journal:

Thin Solid Films

Year:

2017

Language:

english

File:

PDF, 1.98 MB

english, 2017

9

Comparative study of plasmonic antennas fabricated by electron beam and focused ion beam lithography

Horák, Michal, Bukvišová, Kristýna, Švarc, Vojtěch, Jaskowiec, Jiří, Křápek, Vlastimil, Šikola, Tomáš

Journal:

Scientific Reports

Year:

2018

Language:

english

File:

PDF, 2.24 MB

english, 2018

10

The mechanism and suppression of physisorbed-water caused hysteresis in graphene FET sensors

Bartosik, Miroslav, Mach, Jindrich, Piastek, Jakub, Nezval, David, KoneÄnÃ½, Martin, Å varc, VojtÄch, Ensslin, Klaus, Sikola, Tomas

Journal:

Year:

2020

File:

PDF, 4.18 MB

2020

11

Vibrational analysis of the cantilever in non-contact scanning force microscopy

R. Kalousek, F. Lopour, P. Dub, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2000

Language:

english

File:

PDF, 120 KB

english, 2000

12

Fabrication of nanostructures on Si(1 0 0) and GaAs(1 0 0) by local anodic oxidation

Jiří Červenka, Radek Kalousek, Miroslav Bartošík, David Škoda, Ondřej Tomanec, Tomáš Šikola

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 647 KB

english, 2006

13

Stability of hydrogen-terminated vicinal Si(1 1 1) surface under ambient atmosphere

M. Kolíbal, J. Čechal, M. Bartošík, J. Mach, T. Šikola

Journal:

Applied Surface Science

Year:

2010

Language:

english

File:

PDF, 289 KB

english, 2010

14

In situ analysis of Ga-ultrathin films by TOF-LEIS

M. Kolíbal, S. Průša, M. Plojhar, P. Bábor, M. Potoček, O. Tomanec, P. Kostelník, S.N. Markin, P. Bauer, T. Šikola

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2006

Language:

english

File:

PDF, 369 KB

english, 2006

15

Formation of copper islands on a native SiO2 surface at elevated temperatures

Jan Čechal, Josef Polčák, Miroslav Kolíbal, Petr Bábor, Tomáš Šikola

Journal:

Applied Surface Science

Year:

2010

Language:

english

File:

PDF, 532 KB

english, 2010

16

Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling

Petr Bábor, Radek Duda, Stanislav Průša, Tomáš Matlocha, Miroslav Kolíbal, Jan Čechal, Michal Urbánek, Tomáš Šikola

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2011

Language:

english

File:

PDF, 909 KB

english, 2011

17

TOF–LEIS analysis of ultra thin films: Ga and Ga-N layer growth on Si(1 1 1)

Miroslav Kolı́bal, Stanislav Průša, Petr Bábor, Tomáš Šikola

Journal:

Surface Science

Year:

2004

Language:

english

File:

PDF, 413 KB

english, 2004

18

A study of the formation and oxidation of PtSi by SR–PES

Jan Čechal, Tomáš Šikola

Journal:

Surface Science

Year:

2006

Language:

english

File:

PDF, 446 KB

english, 2006

19

The surface oxide: A LEED, DFT and STM study

Petr Kostelník, Nicola Seriani, Georg Kresse, Anders Mikkelsen, Edvin Lundgren, Volker Blum, Tomáš Šikola, Peter Varga, Michael Schmid

Journal:

Surface Science

Year:

2007

Language:

english

File:

PDF, 911 KB

english, 2007

20

A study of Ga layers on Si(1 0 0)-(2 × 1) by SR-PES: Influence of adsorbed water

Jan Čechal, Jindřich Mach, Stanislav Voborný, Petr Kostelník, Petr Bábor, Jiří Spousta, Tomáš Šikola

Journal:

Surface Science

Year:

2007

Language:

english

File:

PDF, 703 KB

english, 2007

21

Morphology of cobalt layers on native SiO2 surfaces at elevated temperatures: Formation of Co islands

Jan Čechal, Jaroslav Luksch, Kateřina Koňáková, Michal Urbánek, Eva Brandejsová, Tomáš Šikola

Journal:

Surface Science

Year:

2008

Language:

english

File:

PDF, 689 KB

english, 2008

22

A study of a LEIS azimuthal scan behavior: Classical dynamics simulation

T. Matlocha, S. Průša, M. Kolíbal, P. Bábor, D. Primetzhofer, S.N. Markin, P. Bauer, T. Sikola

Journal:

Surface Science

Year:

2010

Language:

english

File:

PDF, 1.53 MB

english, 2010

23

Deposition and in-situ characterization of ultra-thin films

Stanislav Voborný, Miroslav Kolı́bal, Jindřich Mach, Jan Čechal, Petr Bábor, Stanislav Průša, Jiřı́ Spousta, Tomáš Šikola

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 146 KB

english, 2004

24

Characterization of oxidized gallium droplets on silicon surface: An ellipsoidal droplet shape model for angle resolved X-ray photoelectron spectroscopy analysis

Jan Čechal, Tomáš Matlocha, Josef Polčák, Miroslav Kolíbal, Ondřej Tomanec, Radek Kalousek, Petr Dub, Tomáš Šikola

Journal:

Thin Solid Films

Year:

2009

Language:

english

File:

PDF, 1.24 MB

english, 2009

25

Ellipsometry and transport studies of thin-film metal nitrides

J Humlı́ček, A Nebojsa, J Hora, M Stráský, J Spousta, T Šikola

Journal:

Thin Solid Films

Year:

1998

Language:

english

File:

PDF, 278 KB

english, 1998

26

Spot intensity processing in LEED images

R Roučka, J Jiruše, T Šikola

Journal:

Year:

2002

Language:

english

File:

PDF, 104 KB

english, 2002

27

Application of simple kinematic predictions for the structural search in LEED

J. Jiruše, T. Šikola

Journal:

Year:

1999

Language:

english

File:

PDF, 179 KB

english, 1999

28

Dual ion-beam deposition of metallic thin films

Tomás Sikola, Jiri Spousta, Libuse Dittrichová, Alois Nebojsa, Vratislav Perina, Radek Ceska, Petr Dub

Journal:

Surface and Coatings Technology

Year:

1996

Language:

english

File:

PDF, 538 KB

english, 1996

29

Deposition of metal nitrides by IBAD

T Šikola, J Spousta, R Češka, J Zlámal, L Dittrichová, A Nebojsa, K Navrátil, D Rafaja, J Zemek, V Peřina

Journal:

Surface and Coatings Technology

Year:

1998

Language:

english

File:

PDF, 273 KB

english, 1998

30

Microhardness of thin molybdenum films

Vladislav Navrátil, Tomáš Šikola

Journal:

Materials Science and Engineering: A

Year:

1997

Language:

english

File:

PDF, 239 KB

english, 1997

31

Application of AFM in microscopy and fabrication of micro/nanostructures

F. Lopour, R. Kalousek, D. Škoda, J. Spousta, F. Matějka, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 156 KB

english, 2002

32

Study of thin oxide films by ellipsometry and ARXPS

P. Tichopádek, A. Nebojsa, J. Čechal, P. Bábor, P. Jurkovič, K. Navrátil, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 113 KB

english, 2002

33

In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films

J. Spousta, M. Urbánek, R. Chmelík, J. Jiruše, J. Zlámal, K. Navrátil, A. Nebojsa, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 198 KB

english, 2002

34

Instrument for thin film diagnostics by UV spectroscopic reflectometry

M. Urbánek, J. Spousta, K. Navrátil, R. Szotkowski, R. Chmelík, M. Buček, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 152 KB

english, 2004

35

In situ analysis of PMPSi by spectroscopic ellipsometry and XPS

J. Čechal, P. Tichopádek, A. Nebojsa, O. Bonaventurová Zrzavecká, M. Urbánek, J. Spousta, K. Navrátil, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 111 KB

english, 2004

36

Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method

Josef Polčák, Jan Čechal, Petr Bábor, Michal Urbánek, Stanislav Průša, Tomáš Šikola

Journal:

Surface and Interface Analysis

Year:

2010

Language:

english

File:

PDF, 216 KB

english, 2010

37

Trimethylsilylester der Fluorselensäure: Herrn Professor Herbert Grunze zum 60. Geburtstag gewidmet

Karcl Dostál, Jiři Šikola

Journal:

Zeitschrift für Chemie

Year:

1983

Language:

german

File:

PDF, 155 KB

german, 1983

38

TOF-LEIS spectra of Ga/Si: Peak shape analysis

M. Kolíbal, O. Tomanec, S. Průša, M. Plojhar, S.N. Markin, L. Dittrichová, J. Spousta, P. Bauer, T. Šikola

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2007

Language:

english

File:

PDF, 936 KB

english, 2007

39

Atomic hydrogen induced gallium nanocluster formation on the Si(1 0 0) surface

Jindřich Mach, Jan Čechal, Miroslav Kolíbal, Michal Potoček, Tomáš Šikola

Journal:

Surface Science

Year:

2008

Language:

english

File:

PDF, 276 KB

english, 2008

40

Ion beam assisted deposition of metallic and ceramic thin films

T. Šikola, J. Spousta, L. Ditrichová, L. Beneš, V. Peřina, D. Rafaja

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1997

Language:

english

File:

PDF, 426 KB

english, 1997

41

Cleaning of metal surfaces by a broad beam ion source

Tomáš Šikola, Libuše Dittrichová, Jiří Spousta, Jakub Zlámal, Jan Štefka

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1997

Language:

english

File:

PDF, 443 KB

english, 1997

42

Design of the entrance ion optics for SIMS and LEIS in situ monitoring of deposition processes

S. Průša, J. Zlámal, T. Šikola

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1998

Language:

english

File:

PDF, 260 KB

english, 1998

43

Deposition of magnetic thin films by IBAD

T Šikola, J Spousta, L Dittrichová, M Stránský, J Zlámal, F Matějka, A Nebojsa, J Zemek, V Peřina, D Rafaja, L Ranno

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1999

Language:

english

File:

PDF, 121 KB

english, 1999

44

Imaging reflectometry in situ

Urbánek, Michal, Spousta, Ji?í, B?hounek, Tomáš, Šikola, Tomáš

Journal:

Year:

2007

Language:

english

File:

PDF, 1.79 MB

english, 2007

45

Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process

Urbánek, M, Uhlíř, V, Bábor, P, Kolíbalová, E, Hrnčíř, T, Spousta, J, Šikola, T

Journal:

Year:

2010

Language:

english

File:

PDF, 1.44 MB

english, 2010

46

Control and Near-Field Detection of Surface Plasmon Interference Patterns

Dvořák, Petr, Neuman, Tomáš, Břínek, Lukáš, Šamořil, Tomáš, Kalousek, Radek, Dub, Petr, Varga, Peter, Šikola, Tomáš

Journal:

Year:

2013

Language:

english

File:

PDF, 1.23 MB

english, 2013

47

Low energy focused ion beam milling of silicon and germanium nanostructures

Kolíbal, Miroslav, Matlocha, Tomáš, Vystavěl, Tomáš, Šikola, Tomáš

Journal:

Year:

2011

Language:

english

File:

PDF, 1.05 MB

english, 2011

48

[American Institute of Aeronautics and Astronautics 45th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics & Materials Conference - Palm Springs, California ()] 45th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics & Materials Conference - Strategies for Tailoring Wings with Bend-Twist Coupling: Part Two

Rehfield, Lawrence, Cheung, Rosita, Sikola, Brett

Year:

2004

Language:

english

File:

PDF, 237 KB

english, 2004

49

Detachment Limited Kinetics of Gold Diffusion through Ultrathin Oxide Layers

Čechal, Jan, Polčák, Josef, Šikola, Tomáš

Journal:

The Journal of Physical Chemistry C

Year:

2014

Language:

english

File:

PDF, 1.34 MB

english, 2014

50

Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams

Kolíbal, Miroslav, Konečný, Martin, Ligmajer, Filip, Škoda, David, Vystavěl, Tomáš, Zlámal, Jakub, Varga, Peter, Šikola, Tomáš

Journal:

Year:

2012

Language:

english

File:

PDF, 4.25 MB

english, 2012